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Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy

Bert Voigtländer

30 mars 2016

193,99 $ ~~Réduction sur le prix courant 241,57 $ à~~

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Description

Langue

anglais

NanoScience and Technology

Publié par: Springer Berlin Heidelberg

ISBN: 9783662452400

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Évaluation éditoriale

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