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Kelvin Probe Force Microscopy: Measuring And Compensating Electrostatic Forces

Sascha Sadewasser Édition : Thilo Glatzel

30 novembre 2013

160,95 $

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Description

Langue

anglais

Pages

334

Springer Series in Surface Sciences

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9783642271137

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Évaluation éditoriale

thilo glatzel

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