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Free Preview of Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy

Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy

Bert Voigtländer
Mar 23, 2015
$291.95
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Overview

Appropriate for
Language
English
No. of Pages
382
NanoScience and Technology
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9783662452394
Life stage: null

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