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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

Pradeep LALL , Michael G. Pecht , Edward B. Hakim
Jun 19, 2019
$81.50
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Overview

Appropriate for
Language
English
No. of Pages
336
Publisher: CRC Press
Shipping dimensions: 10" H x 7" W x 1" L
ISBN: 9780367400972
Life stage: null

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