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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Jacopo Franco , Ben Kaczer , Guido Groeseneken

Oct 29, 2013

$160.95

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Overview

Language

English

No. of Pages

187

Springer Series In Advanced Microelectronics

Publisher: Springer/Sci-Tech/Trade

Shipping dimensions: 9" H x 6" W x 1" L

ISBN: 9789400776623

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