• From Contamination to Defects, Faults and Yield Loss: Simulation and Applications
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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

Jitendra B. Khare , Wojciech Maly
Sep 26, 2011
$160.95
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Overview

Appropriate for
Language
English
No. of Pages
150
Frontiers in Electronic Testing
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781461285953
Life stage: null

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