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Testability Concepts for Digital ICs: The Macro Test Approach

F.p.m. Beenker , R.g. Bennetts , A.p. Thijssen
Oct 04, 2012
$248.50
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Overview

Appropriate for
Language
English
No. of Pages
212
Frontiers in Electronic Testing
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781461360049
Life stage: null

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