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Testability Concepts for Digital ICs: The Macro Test Approach

F.p.m. Beenker , R.g. Bennetts , A.p. Thijssen

4 octobre 2012

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Description

Langue

anglais

Pages

212

Frontiers in Electronic Testing

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9781461360049

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