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Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy

K. C. Khulbe , C. Y. Feng , Takeshi Matsuura

17 décembre 2007

160,95 $

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Description

Langue

anglais

Pages

198

Springer Laboratory

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9783540739937

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