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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Ruijing Shen , Sheldon X.-d. Tan , Hao Yu

18 mars 2012

160,95 $

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Description

Langue

anglais

Pages

306

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9781461407874

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