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Metrology And Diagnostic Techniques For Nanoelectronics

Zhiyong Ma Édition : David G. Seiler

3 octobre 2016

769,95 $

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Description

Langue

anglais

Pages

1.454

Publié par: Pan Stanford Publishing

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9789814745086

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david g seiler

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