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Fault-Tolerance Techniques for SRAM-Based FPGAs

Fernanda Lima Kastensmidt , Ricardo Reis

29 novembre 2010

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Description

Langue

anglais

Pages

184

Frontiers in Electronic Testing

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9781441940520

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