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Noise in Semiconductor Devices: Modeling and Simulation

Fabrizio Bonani , Giovanni Ghione

26 décembre 2012

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Description

Langue

anglais

Pages

213

Springer Series In Advanced Microelectronics

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9783642085864

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