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Hierarchical Modeling for VLSI Circuit Testing

Debashis Bhattacharya , John P Hayes

31 décembre 1989

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Description

Langue

anglais

Pages

160

The Springer International Engineering and Computer Science

Publié par: Springer US

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9780792390589

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