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Characterization Methods for Submicron MOSFETs

Édition : Hisham Haddara

26 septembre 2011

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Description

Langue

anglais

Pages

232

The Springer International Engineering and Computer Science

Publié par: Springer US

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9781461285847

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Évaluation éditoriale

hisham haddara

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